Have your voice heard among your peers and experts in nanotechnology!
Welcome to Seeing at the Nanoscale VI, the annual scientific conference focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.
The conference location is in the center of Berlin, Germany, July 9-11, 2008. Sponsored by Veeco Instruments and supported by
Humboldt University Berlin, Department of Physics, this event includes technical presentations, a nanotechnology poster contest, and a gala dinner to get special flaviour from Berlin.
Highlighted by the conference chairman
Prof. Dr. Jürgen P. Rabe Seeing at the Nanoscale VI provides an optimum forum for "scientists to speak to scientists" on a wide variety of nanotechnology topics with four technical sessions on:
Extending the limits of SPM: high speed scanning, ultra high resolution imaging, multiple probe SPM, novel probes
Georg Schitter TU Delft, Delft, The Netherlands
Toshio Ando Kanazawa University, Kanazawa, Japan
Oscar Custance National Institute for Material Science (NIMS), Tsukuba, Japan
From single biomolecules to cells: using AFM and combined AFM-optical
Hans Oberleithner Universitat Muenster, Muenster, Germany
Daniel Mueller BIOTEC, Dresden, Germany
Clive Roberts Chair of Pharmaceutical Nanotechnology, School of Pharmacy and Director of the Nottingham Nanotechnology and Nanoscience Centre The University of Nottingham, United Kingdom
Next generation materials and polymer systems
G.J. Vancso Universiteit Twente, Enschede, The Netherlands
Jiro Kumaki Yashima Super-structured Helix Project, ERATO, JST, Nagoya, Japan
Christian Fretigny CNRS, Paris, France
Beyond topography: measurement of physical properties at the Nanoscale
-nanomechanical, electrical, optical, magnetic and thermal
Robert W. Stark Ludwig-Maximilians-Universitat Muenchen, Munich, Germany
Wilfried Vandervorst, IMEC, Leuven, Belgium and Dept. Physics, KULeuven, Belgium
Ozgur Sahin Harvard University, USA
Book the dates in your diary! 9-11 July 2008