Metrology & Instrumentation
Process Equipment
Epitaxial Equipment
Metrology & Instrumentation
Optical Profilers - Systems
Wyko NT9100 Optical Profiler 
The new bench-top Wyko NT9100 Optical Profiling System shares many of the performance attributes of the larger ninth-generation NT9000 systems, including: easy measurement setup, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability.
The new bench-top Wyko NT9100 Optical Profiling System shares many of the performance attributes of the larger ninth-generation NT9000 systems, including: easy measurement setup, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability.
Wyko NT9800
The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution.
The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution.
Wyko DMEMS NT1100
Table-top profiler with dynamic MEMS measurement option generates animations of MEMS devices in motion.
Table-top profiler with dynamic MEMS measurement option generates animations of MEMS devices in motion.
Wyko DMEMS NT3300
Non-contact dynamic MEMS model of the NT3300 delivers automated 3D measurement and analysis of micro-devices in motion
Non-contact dynamic MEMS model of the NT3300 delivers automated 3D measurement and analysis of micro-devices in motion
Wyko HD8100
Highest performance profiler for data storage metrology provides fast, non-contact characterization of magnetic thin-film heads, including pole-tip recession (PTR) and ABS flatness.
Highest performance profiler for data storage metrology provides fast, non-contact characterization of magnetic thin-film heads, including pole-tip recession (PTR) and ABS flatness.
Wyko NT1100
Optical profiler providing high resolution 3D surface measurement, from sub-nanometer roughness to millimeter-high steps.
Optical profiler providing high resolution 3D surface measurement, from sub-nanometer roughness to millimeter-high steps.
Wyko NT9300
The Wyko NT9300 utilizes Veeco's ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
The Wyko NT9300 utilizes Veeco's ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
Wyko SP3050
This automated optical profiler provides fast, non-contact, 3D inspection of large panels.
This automated optical profiler provides fast, non-contact, 3D inspection of large panels.
Wyko SP3250
This gauge-capable system provides dual-mode 3D measurement of bumps or panels for defect inspection and in-line performance monitoring.
This gauge-capable system provides dual-mode 3D measurement of bumps or panels for defect inspection and in-line performance monitoring.
Wyko SP9900
Veeco's third-generation, large-format surface profiling system provides unprecedented measurement performance and capability on substrate panels, bumped substrates, flat panels, and circuit boards.
Veeco's third-generation, large-format surface profiling system provides unprecedented measurement performance and capability on substrate panels, bumped substrates, flat panels, and circuit boards.
Wyko Optical Metrology Module
Stand-alone model brings high speed, automated metrology to the factory floor, for in-situ production measurement and 100% sampling.
Stand-alone model brings high speed, automated metrology to the factory floor, for in-situ production measurement and 100% sampling.